• Revolutionary AFM-nDMA
  For the first time an AFM can provide complete and quantitative viscoelastic analysis of polymers at the nanoscale, probing materials at rheologically relevant frequencies, in the linear regime. Proprietary dual-channel detection, phase-drift correction, and reference frequency tracking enable a small strain measurement in the rheologically relevant 0.1 Hz to 20 kHz range for nanoscale measurements of storage modulus, loss modulus, and loss tangent that tie directly to bulk DMA.

   

• Exclusive PeakForce QNM
  Quantitative characterization of nanomechanical properties—including modulus, adhesion, dissipation, and deformation — while simultaneously imaging sample topography at atomic-scale resolution has become a routine endeavor with this mode. Now Bruker’s frequency-calibrated probes enable defined geometry and adhesion to track probe-sample contact with the lowest uncertainty in measurements of sticky-soft materials in the <1kPa to 100 GPa range, while rendering results with high-resolution nanoscale mapping.

   

• FASTForce Volume
  This mode extends the operating frequency of linear ramps by >400 Hz, closing the frequency gap between
  PeakForce QNM and standard Force Volume mapping. The overlap of operating frequencies facilitates nanomechanical correlative studies between modes, rendering greater measurement confidence while allowing investigation of property material frequency dependency.

   

• Innovative FASTForce Volume CR
  Due to its ability to measure a wide range of moduli, contact resonance is a powerful tool for nanomechanical measurements. However, until now, its implementation has been hampered by contact mode’s limitations, including slow imaging speed, complex analysis, and the requirement of specialized hardware for full spectrum acquisition. XR Nanomechanics resolves these issues, providing consistent data of both elastic and viscoelastic properties.

• Raman spectral imaging: acquisition of a complete Raman spectra at every image pixel
• Planar (x-y-direction) and depth scans (z-direction) with manual sample positioning
• Image stacks: 3D confocal Raman imaging
• Time series
• Single point Raman spectrum acquisition
• Single-point depth profiling
• Fibre-coupled UHTS spectrometer specifically designed for Raman microsopy and applications with low light intensities
• Confocal Fluorescence Microscopy
• Bright Field Microscopy
  

• Class-Leading Usability

  SmartSEM Touch puts interactive workflow control directly at your fingertips. It is quick and easy to learn, dramatically reducing training effort and costs. Within minutes,
  even new users will begin capturing stunning images. This user interface also supports industrial operators who require automated workflows for repeatable inspection tasks

• Excellent Image Quality

  EVO excels at extracting the maximum data quality from uncoated and unaltered samples. EVO also safeguards data quality on hydrated and heavily contaminated samples, by allowing these samples to remain in their native state. Additionally, the LaB6 emitter will give that extra bit of resolution, contrast and signal-to-noise
  that is important when imaging and microanalysis get challenging.

• Automated Intelligent Imaging

  EVO enables automated, unattended acquisition of images across sample batches. ZEISS Automated Intelligent Imaging is perfectly suited to routine inspection. It
  enables the user to define a boundary region, automatically generate regions of interest determined by the required field of view or magnification, and begin
  automated acquisition. Automated Intelligent Imaging will improve your sample throughput, boosting productivity and performance.

• Better Data with a Lanthanum Hexaboride (LaB6) Electron Emitter
  

  Electron emission from a lanthanum hexaboride cathode, rather than a traditional tungsten hairpin filament, provides the reassurance that every extra bit of image quality is
  there when you need it. And that is a benefit you can put into action in two ways:

  1.      At equivalent electron probe sizes (i.e. resolution), there is more probe current to work with, which makes image navigation and optimization much easier.

  2.      At equivalent probe currents (signal-to-noise), the beam diameter is much smaller, resulting in enhanced image resolution.

ZEISS SmartEDX is the dedicated microanalysis solution designed specifically for analytical routine applications performed on the ZEISS EVO Family

SmartEDX provides highest (output count rate) throughput at 129 eV energy resolution and 1-5 nA probe current, which is the typical analytical operating condition for the ZEISS EVO Scanning Electron Microscopes.