Speaker: Prof. Paulo.J. Ferreira
Abstract Details: Aberration-Corrected TEM/STEM, and In-Situ TEM have emerged as powerful tools for the characterization of nanomaterials. Aberration-Corrected TEM/STEM enable atomic and structural imaging resolution below 0.1 nanometers while performing chemical analysis at the atomic level, while in-situ TEM allows dynamic real-time imaging of nanomaterials behavior. In this talk, a brief overview of Aberration-Corrected TEM/STEM, and in-situ TEM will be presented and related to the quest for investigating nanomaterials. Subsequently, two examples showing the power of these techniques in providing scientific insight will be discussed.  First, using aberration-corrected HAADF/STEM imaging and STEM simulations, as well as EELS analyses, the atomic structure and composition of Li-ion battery materials will be discussed. Second, aberration-corrected STEM and in-situ TEM of Pt, Pt-alloy and Ag nanoparticles will be presented.

About The Speaker: Professor Paulo.J. Ferreira Robert & Jane Mitchell Endowed Faculty Fellowship in Engineering Director of the Center for Electron Microscopy Materials Science & Engineering Program The University of Texas at Austin Austin, TX, 78712, USA

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