Speaker: Prof. Paulo.J. Ferreira
Abstract Details: Aberration-Corrected TEM/STEM, and In-Situ TEM have emerged as powerful tools for the characterization of nanomaterials. Aberration-Corrected TEM/STEM enable atomic and structural imaging resolution below 0.1 nanometers while performing chemical analysis at the atomic level, while in-situ TEM allows dynamic real-time imaging of nanomaterials behavior. In this talk, a brief overview of Aberration-Corrected TEM/STEM, and in-situ TEM will be presented and related to the quest for investigating nanomaterials. Subsequently, two examples showing the power of these techniques in providing scientific insight will be discussed. Â First, using aberration-corrected HAADF/STEM imaging and STEM simulations, as well as EELS analyses, the atomic structure and composition of Li-ion battery materials will be discussed. Second, aberration-corrected STEM and in-situ TEM of Pt, Pt-alloy and Ag nanoparticles will be presented.
About the Speaker: Professor Paulo.J. Ferreira
Robert & Jane Mitchell Endowed Faculty Fellowship in Engineering
Director of the Center for Electron Microscopy
Materials Science & Engineering Program
The University of Texas at Austin
Austin, TX, 78712, USA