Equipment Training Video
Scanning Electron Microscopy (SEM) With Energy Dispersive Spectroscopy (EDS)
SEM is a widely used method for imaging microstructure and morphology of materials. Combined with EDS, researchers have a powerful imaging tool that also provides spatially resolved elemental information.
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Class-Leading Usability
SmartSEM Touch puts interactive workflow control directly at your fingertips. It is quick and easy to learn, dramatically reducing training effort and costs. Within minutes, even new users will begin capturing stunning images. This user interface also supports industrial operators who require automated workflows for repeatable inspection tasks -
Excellent Image Quality
EVO excels at extracting the maximum data quality from uncoated and unaltered samples. EVO also safeguards data quality on hydrated and heavily contaminated samples, by allowing these samples to remain in their native state. Additionally, the LaB6 emitter will give that extra bit of resolution, contrast and signal-to-noise that is important when imaging and microanalysis get challenging. -
Automated Intelligent Imaging
EVO enables automated, unattended acquisition of images across sample batches. ZEISS Automated Intelligent Imaging is perfectly suited to routine inspection. It enables the user to define a boundary region, automatically generate regions of interest determined by the required field of view or magnification, and begin automated acquisition. Automated Intelligent Imaging will improve your sample throughput, boosting productivity and performance. - Better Data with a Lanthanum Hexaboride (LaB6) Electron Emitter
Electron emission from a lanthanum hexaboride cathode, rather than a traditional tungsten hairpin filament, provides the reassurance that every extra bit of image quality is there when you need it. And that is a benefit you can put into action in two ways:1. At equivalent electron probe sizes (i.e. resolution), there is more probe current to work with, which makes image navigation and optimization much easier.
2. At equivalent probe currents (signal-to-noise), the beam diameter is much smaller, resulting in enhanced image resolution.